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Unilab thanks to its vast fleet of instruments offers services for profiling and roughness, but also for chamfers, fittings and roughness parameters such as Ra, Rz, Rz1max, Rmax.
These are detected by profilometer, roughness meter, projector profiles up to the best Zeiss microscopes on the market.
Unilab offers the possibility of choosing between very precise and advanced instruments, for example, based on the needs of the customer we recommend the use of a stylus profilometer for morphological characterization as it allows to analyze surfaces with greater precision than the roughness meter.
The instrument has a diamond stylus that moves first vertically in contact with the sample and then laterally to measure specific contact distances and forces.
The measurements it can make are small variations of the surface in vertical as functions of the position of the stylus on any type of material and with any kind of geometry.
The contact roughness meter performs surface roughness analysis which is measured by passing the probe over the sample surface.
The instrument allows a quick analysis of the surface of a component and shows the average roughness depth Rz and the average roughness value Ra in μm.
Our laboratory provides a series of services on site thanks to the use of our mobile laboratory that allows us to make measurements directly at the customer company.
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